WebLYRA3 Home > Products > TescanLYRA3 satisfies the nowadays needs for sample characterisation and microanalysis in materials science and industry. In addition, beam / ion lithography as well as circuit editing of multi-layered microelectronic devices, are tasks at which LYRA3 excels. High-throughput and powerful yet easy-to-use software allows even …

TESCAN FIB-SEM LYRA3 used for TEM lamellae …

WebFIB-SEM-based electron deposition of platinum “buttons” prior to standard lift-out and sharpening procedures for atom probe specimen manufacture. In combination, FIB-ToF-SIMS analysis and application of the “button” method ensure that even the smallest APT targets can be successfully captured in extracted needles. WebThe video below presents the whole TEM sample preparation procedure using a TESCAN LYRA3 dual beam FIB-SEM platform (Cobra FIB) equipped with a GIS (5-line GIS) and a micromanipulator: This video is private Watch on Reference: Focused Ion Beam Microscopy and Micromachining C.A.Volkert and A.M. Minor Figure 1. Cross-section micromachining … down down far down upon the untroubled green

Scanning Electron Microscope – LSP

Web1 May 2024 · Sample preparation for TEM was done with a TESCAN LYRA3 FIB workstation equipped with a SEM via in situ methods described by Giannuzzi in ref. [8]. Specimens were further ion milled at 2 kV and 77 pA to remove Ga ion beam damage and achieve a final thickness of approximately 80 nm. Web18 Mar 2024 · The TESCAN Lyra 3 XMU SEM-FIB system TESCAN Lyra 3 XMU SEM-FIB is used for thin lamella preparations, but also for morphological, analytical and structural investigations via SEM, EDS and EBSD. Investigation Possibilities: WebTESCAN LYRA3 FIB-SEM . FIB Imaging and Basic FIB Processes. 1. Focus and go to WD&Z 20 mm, tick the Keep view field checkbox and tilt the sample stage to 55 degrees. 2. Refocus and go to WD&Z 9 mm. 3. Select the FIB Beam Energy (30 keV recommended) using the combo box in the panel or use the Ion Beam Pad cladding selco